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Dive into the research topics where Eilam Yalon is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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A Comparative Study of Digital Memristor-Based Processing-In-Memory from a Device and Reliability Perspective
Neuner, T., Padberg, H., Kornblum, L., Yalon, E., Amiri, P. K. & Kvatinsky, S., 7 Jan 2026, In: Advanced Electronic Materials. 12, 1, e00348.Research output: Contribution to journal › Review article › peer-review
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A Reconfigurable Time-Domain In-Memory Computing Macro Using FeFET-Based CAM With Multilevel Delay Calibration in 28-nm CMOS
Mattar, J., Dahan, M. M., Dunkel, S., Mulaosmanovic, H., Beernink, G., Beyer, S., Yalon, E. & Wainstein, N., 2026, (Accepted/In press) In: IEEE Transactions on Circuits and Systems I: Regular Papers.Research output: Contribution to journal › Article › peer-review
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Ferroelectric Polarization Effect on Charge Trapping in HfO2 FeFETs Examined via Random Telegraph Noise
Zilberman, G., Dahan, M. M., Ber, E., Kurzweil, J., Knobloch, T., Mulaosmanovic, H., Dunkel, S., Muller, J., Beyer, S., Grasser, T. & Yalon, E., 2026, (Accepted/In press) In: IEEE Transactions on Electron Devices.Research output: Contribution to journal › Article › peer-review
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Asymmetric and Symmetric Single-Pole Double-Throw With Improved Power Handling Using Indirectly Heated Phase-Change Switches
Wainstein, N., Orren, A., Nir-Harwood, R. G., Yalon, E. & Kvatinsky, S., 2025, In: IEEE Transactions on Electron Devices. 72, 1, p. 344-349 6 p.Research output: Contribution to journal › Article › peer-review
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First Comparative Thermal Evaluation of 2D Semiconductor vs. Silicon Nanosheet Transistors
Song, Y. S., Su, H., Pena, T., Persson, A. E. O., Yang, K., Yalon, E., Bennett, R. K. A., Han, Z., Neilson, K., Kang, J., Yang, J. A., Wong, H. S. P., Wang, S. X. & Pop, E., 2025, 2025 IEEE International Electron Devices Meeting, IEDM 2025. (Technical Digest - International Electron Devices Meeting, IEDM).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review