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A Highly Reliable Dual-Mode RRAM PUF With Key Concealment Scheme
Jiang Li
, Yijun Cui
, Chongyan Gu
, Chenghua Wang
, Weiqiang Liu
,
Shahar Kvatinsky
Electrical and Computer Engineering
Research output
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Contribution to journal
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Article
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peer-review
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Keyphrases
Resistive Random Access Memory (ReRAM)
100%
Highly Reliable
100%
Concealment
100%
Dual-mode
100%
Physical Unclonable Function
100%
Flexible Modes
20%
High Reliability
10%
Internet of Things
10%
Vulnerability
10%
In-memory Computing
10%
Memory Array
10%
Wide Temperature Range
10%
Entropy Source
10%
Switching Capability
10%
Hardware Overhead
10%
Differential Mode
10%
Post-processing Operations
10%
Hardware Security
10%
Integration Density
10%
High Security Application
10%
Computer Science
Random Access Memory
100%
Memory Array
16%
Postprocessing
16%
High Reliability
16%
Security Application
16%
Hardware Overhead
16%
Hardware Security
16%
Internet-Of-Things
16%
Engineering
Resistive Random Access Memory
100%
Temperature Range
10%
Source Entropy
10%
Postprocessing Operation
10%
Differential Mode
10%
Memory Array
10%
Hardware Overhead
10%
Internet-Of-Things
10%