Asymmetric Loss For Multi-Label Classification

Tal Ridnik, Emanuel Ben-Baruch, Nadav Zamir, Asaf Noy, Itamar Friedman, Matan Protter, Lihi Zelnik-Manor

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In a typical multi-label setting, a picture contains on average few positive labels, and many negative ones. This positive-negative imbalance dominates the optimization process, and can lead to under-emphasizing gradients from positive labels during training, resulting in poor accuracy. In this paper, we introduce a novel asymmetric loss (”ASL”), which operates differently on positive and negative samples. The loss enables to dynamically down-weights and hard-thresholds easy negative samples, while also discarding possibly mislabeled samples. We demonstrate how ASL can balance the probabilities of different samples, and how this balancing is translated to better mAP scores. With ASL, we reach state-of-the-art results on multiple popular multi-label datasets: MS-COCO, Pascal-VOC, NUS-WIDE and Open Images. We also demonstrate ASL applicability for other tasks, such as single-label classification and object detection. ASL is effective, easy to implement, and does not increase the training time or complexity. Implementation is available at: https://github.com/Alibaba-MIIL/ASL.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE/CVF International Conference on Computer Vision, ICCV 2021
Pages82-91
Number of pages10
ISBN (Electronic)9781665428125
DOIs
StatePublished - 2021
Externally publishedYes
Event18th IEEE/CVF International Conference on Computer Vision, ICCV 2021 - Virtual, Online, Canada
Duration: 11 Oct 202117 Oct 2021

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499

Conference

Conference18th IEEE/CVF International Conference on Computer Vision, ICCV 2021
Country/TerritoryCanada
CityVirtual, Online
Period11/10/2117/10/21

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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