CMOS-SOI-MEMS Uncooled Infrared Security Sensor with Integrated Readout

Tomer Saraf, Igor Brouk, Sharon Bar-Lev Shefi, Aharon Unikovsky, Tanya Blank, Praveen Kumar Radhakrishnan, Yael Nemirovsky

Research output: Contribution to journalArticlepeer-review

Abstract

A new generation of uncooled passive infrared (PIR) security sensors based on a suspended thermal transistor MOS (TMOS), fabricated in standard CMOS-SOI process, released by post-etching, and wafer level packaged achieving a vacuum of <4 Pa, has been developed at the Technion. One of the important features of TMOS is very low power consumption (in this case, ∼ 2-4 nWatt) due to its subthreshold operation requiring ∼ 10 nA at 0.2 V, enabling wide range of battery applications. This paper focuses on the analog design of monolithically integrated readout for the electronic system, formed by the PIR sensor, its front-end analog interface and the processing circuitry. The measured signal-to-noise ratio of this system is 100-200, depending on the operation point, at the black-body temperature of 50° C, while the total input referred noise is ≤ 1μ Vrms and the total system current consumption is no more than 20μ A. The sensors and read-out are processed with the same CMOS-SOI technology.

Original languageEnglish
Article number7447662
Pages (from-to)155-162
Number of pages8
JournalIEEE Journal of the Electron Devices Society
Volume4
Issue number3
DOIs
StatePublished - May 2016

Keywords

  • Infrared detectors
  • Integrated circuits
  • Semiconductor devices
  • Sensor arrays
  • Thermal sensors

ASJC Scopus subject areas

  • Biotechnology
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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