Enhancing tapping mode atomic force microscopy using AutoResonance control and a hybrid dynamic model

We present a novel method for analyzing tapping mode atomic force microscopy (AFM), enhancing topography reconstruction's accuracy and speed. Our approach integrates an automatic resonance-tracking control scheme with a hybrid dynamic model that considers interactions between the AFM tip and the sample, and the oscillating sensor dynamics. A key aspect of our method is a simplified model that captures intricate dynamic behavior as a function of the distance from the topography. This model enables the immediate approximation of the distance from the topography, eliminating the necessity to lock onto the nominal distance as done with classical AFMs. To validate the accuracy, we conducted numerical simulations of Van der Waals and capillary interaction forces, as well as experimental measurements of a coin's topography. The results affirm the effectiveness of our approach in enhancing AFM imaging and characterization capabilities.