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Exploring Charge Trapping Dynamics in Si:HfO-FeFETs by Temperature-Dependent Electrical Characterization

  • Mor Mordechai Dahan
  • , Emanuel Ber
  • , Or Levit
  • , Halid Mulaosmanovic
  • , Stefan Dunkel
  • , Johannes Muller
  • , Sven Beyer
  • , Eilam Yalon

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Material Science