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Exploring Charge Trapping Dynamics in Si:HfO-FeFETs by Temperature-Dependent Electrical Characterization
Mor Mordechai Dahan, Emanuel Ber, Or Levit, Halid Mulaosmanovic, Stefan Dunkel, Johannes Muller, Sven Beyer, Eilam Yalon
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review