Grain boundary diffusion in recrystallizing nanocrystalline materials

L. Klinger; Y. Amouyal; S. V. Divinski; E. Rabkin

doi:10.4028/www.scientific.net/DDF.289-292.641

Grain boundary diffusion in recrystallizing nanocrystalline materials

L. Klinger, Y. Amouyal, S. V. Divinski, E. Rabkin

Materials Science & Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A model that considers diffusion in nanocrystalline materials undergoing recrystallization was developed. Application of this model enabled us deriving ⁶³Ni radiotracer diffusion coefficients along the grain boundaries in ultrafine grain copper produced by equal channel angular pressing from the experimentally measured radiotracer penetration profiles.

Original language	English
Title of host publication	Diffusion in Materials - DIMAT2008
Pages	641-648
Number of pages	8
Volume	289-292
DOIs	https://doi.org/10.4028/www.scientific.net/DDF.289-292.641
State	Published - 2009
Event	7th International Conference on Diffusion in Materials - Lanzarote, Spain Duration: 28 Oct 2008 → 31 Oct 2008

Conference

Conference	7th International Conference on Diffusion in Materials
Country/Territory	Spain
City	Lanzarote
Period	28/10/08 → 31/10/08

Keywords

Copper alloys
Grain boundaries (GBs)
Grain boundary diffusion
Recrystallization

ASJC Scopus subject areas

Radiation
General Materials Science
Condensed Matter Physics

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Cite this

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title = "Grain boundary diffusion in recrystallizing nanocrystalline materials",

abstract = "A model that considers diffusion in nanocrystalline materials undergoing recrystallization was developed. Application of this model enabled us deriving 63Ni radiotracer diffusion coefficients along the grain boundaries in ultrafine grain copper produced by equal channel angular pressing from the experimentally measured radiotracer penetration profiles.",

keywords = "Copper alloys, Grain boundaries (GBs), Grain boundary diffusion, Recrystallization",

author = "L. Klinger and Y. Amouyal and Divinski, {S. V.} and E. Rabkin",

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language = "אנגלית",

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AU - Divinski, S. V.

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AB - A model that considers diffusion in nanocrystalline materials undergoing recrystallization was developed. Application of this model enabled us deriving 63Ni radiotracer diffusion coefficients along the grain boundaries in ultrafine grain copper produced by equal channel angular pressing from the experimentally measured radiotracer penetration profiles.

KW - Copper alloys

KW - Grain boundaries (GBs)

KW - Grain boundary diffusion

KW - Recrystallization

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T2 - 7th International Conference on Diffusion in Materials

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ER -

Grain boundary diffusion in recrystallizing nanocrystalline materials

Abstract

Conference

Keywords

ASJC Scopus subject areas

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