Introduction to Scanning Electron Microscopy

Christina Scheu, Wayne D. Kaplan

Research output: Chapter in Book/Report/Conference proceedingForeword/postscript

3 Scopus citations
Original languageEnglish
Title of host publicationIn-Situ Electron Microscopy
Subtitle of host publicationApplications in Physics, Chemistry and Materials Science
Pages1-37
Number of pages37
DOIs
StatePublished - 24 Apr 2012

Keywords

  • Backscattered electrons
  • Contrast mechanisms
  • Dispersive X-ray spectroscopy
  • Electromagnetic lenses
  • Electron backscattered diffraction
  • Electron guns and detectors
  • Electron-matter interaction
  • Interaction volume
  • Resolution
  • Scanning electron microscope
  • Secondary electrons

ASJC Scopus subject areas

  • General Chemistry

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