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Measurements and simulations of low dark count rate single photon avalanche diode device in a low voltage 180-nm CMOS image sensor technology

  • Tomer Leitner
  • , Amos Feiningstein
  • , Renato Turchetta
  • , Rebecca Coath
  • , Steven Chick
  • , Gil Visokolov
  • , Vitali Savuskan
  • , Michael Javitt
  • , Lior Gal
  • , Igor Brouk
  • , Sharon Bar-Lev
  • , Yael Nemirovsky

Research output: Contribution to journal › Article › peer-review

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