Measurements and simulations of low dark count rate single photon avalanche diode device in a low voltage 180-nm CMOS image sensor technology

Tomer Leitner, Amos Feiningstein, Renato Turchetta, Rebecca Coath, Steven Chick, Gil Visokolov, Vitali Savuskan, Michael Javitt, Lior Gal, Igor Brouk, Sharon Bar-Lev, Yael Nemirovsky

Research output: Contribution to journal › Article › peer-review

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