MOCVD growth of ordered Cd(1-x)ZnxTe epilayers

K. Cohen, S. Stolyarova, N. Amir, A. Chack, R. Beserman, R. Weil, Y. Nemirovsky

Research output: Contribution to journalConference articlepeer-review

Abstract

This work reports for the first time the preparation of ordered Cd(1-x)ZnxTe epilayers. The epilayers were deposited on CdTe (1 0 0) substrates by metal organic chemical vapor deposition in a horizontal quartz reactor. Diethylzinc, dimethylcadmium and diethyltelluride were used as metalorganic precursors with hydrogen as a carrier gas. Influence of different growth parameters on the growth process is studied for the deposited Cd(1-x)ZnxTe layers. Transmission electron microscopy diffraction was performed and the long-range ordering effect was observed for the first time, in these layers. The appearance of extra spots attributed to (h ± 1/2 , k ∓ 1/2 , l ± 1/2 ) planes is the indication of CuPt-type atomic ordering in the CdZnTe epilayers.

Original languageEnglish
Pages (from-to)1174-1178
Number of pages5
JournalJournal of Crystal Growth
Volume198-199
Issue numberpt 2
DOIs
StatePublished - Mar 1999
EventProceedings of the 1998 10th International Conference on Vapor Growth and Epitaxy and Specialist Workshops on Crystal Growth, ICVGE-10 - Jerusalem, Isr
Duration: 26 Jul 199831 Jul 1998

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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