TY - GEN
T1 - Modeling the thermal performance of a packaged MEMS thermal sensor at wide pressure range for IoT applications
AU - Avraham, Moshe
AU - Shabtay, Ayal
AU - Shlenkevitch, Dima
AU - Stolyarova, Sara
AU - Blank, Tanya
AU - Nemirovsky, Yael
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/11
Y1 - 2019/11
N2 - This paper focuses on the thermal performance of a wafer level packaged MEMS thermal sensor, where the pressure varies between deep vacuum (0.1 Pa) and atmospheric pressure. The simulations are based on commercial software and are corroborated by modeling and measurements. There is a good agreement between the measured experimental data for the thermal time constant and the modeling and simulations.
AB - This paper focuses on the thermal performance of a wafer level packaged MEMS thermal sensor, where the pressure varies between deep vacuum (0.1 Pa) and atmospheric pressure. The simulations are based on commercial software and are corroborated by modeling and measurements. There is a good agreement between the measured experimental data for the thermal time constant and the modeling and simulations.
KW - Gas conduction at intermediate pressure
KW - MEMS sensors
KW - TMOS
KW - Thermal sensors
KW - Wafer-level packaging
UR - http://www.scopus.com/inward/record.url?scp=85078954646&partnerID=8YFLogxK
U2 - 10.1109/COMCAS44984.2019.8958080
DO - 10.1109/COMCAS44984.2019.8958080
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AN - SCOPUS:85078954646
T3 - 2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2019
BT - 2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2019
T2 - 2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2019
Y2 - 4 November 2019 through 6 November 2019
ER -