Modeling the thermal performance of a packaged MEMS thermal sensor at wide pressure range for IoT applications

Moshe Avraham, Ayal Shabtay, Dima Shlenkevitch, Sara Stolyarova, Tanya Blank, Yael Nemirovsky

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper focuses on the thermal performance of a wafer level packaged MEMS thermal sensor, where the pressure varies between deep vacuum (0.1 Pa) and atmospheric pressure. The simulations are based on commercial software and are corroborated by modeling and measurements. There is a good agreement between the measured experimental data for the thermal time constant and the modeling and simulations.

Original languageEnglish
Title of host publication2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2019
ISBN (Electronic)9781538695494
DOIs
StatePublished - Nov 2019
Event2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2019 - Tel-Aviv, Israel
Duration: 4 Nov 20196 Nov 2019

Publication series

Name2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2019

Conference

Conference2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2019
Country/TerritoryIsrael
CityTel-Aviv
Period4/11/196/11/19

Keywords

  • Gas conduction at intermediate pressure
  • MEMS sensors
  • TMOS
  • Thermal sensors
  • Wafer-level packaging

ASJC Scopus subject areas

  • Information Systems and Management
  • Electrical and Electronic Engineering
  • Instrumentation
  • Artificial Intelligence
  • Computer Networks and Communications

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