Scanning probe microscopy study of grain boundary migration in nial

Eugen Rabkin, Yaron Amouyal, Leonid Klinger

Research output: Contribution to journalArticlepeer-review

Abstract

A post-mortem scanning probe microscopy (SPM) study of grain boundary migration in Ni-rich NiAl at 1400°C is presented. The migration of grain boundaries during annealing is quantified using the SPM measurements of surface topography of the regions swept by migrating grain boundaries. It is shown that the quantitative conclusions about the dynamics of grain boundary motion can be drawn from the study of surface topography in the vicinity of both individual migrated boundaries and migrated triple junctions. In the case of individual boundaries, the curvature of the blunted root of the grain boundary groove formed at original boundary position provides the information about the beginning of migration process. In the case of triple junctions that moved along one of three boundaries forming the junction, the variable width of the grain boundary groove allows to recover the dynamics of migration process. Using the Mullins model of grain boundary grooving and its modifications we estimated that the grain boundary migration rate is 0.52 ±0.09 μm/s. This is much higher than the average migration rate obtained by dividing the migrated distance by total annealing time. It is concluded that in the near-surface region of NiAl the grain boundaries migrate in jerky, spasmodic fashion.

Original languageEnglish
Pages (from-to)4953-4959
Number of pages7
JournalActa Materialia
Volume52
Issue number17
DOIs
StatePublished - 4 Oct 2004

Keywords

  • Grain boundaries
  • Grain boundary migration
  • Scanning probe microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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