Electrostatically driven micro resonator with a CMOS capacitive read out

Yinon Satuby, Uri Ben-Yehuda, Claudio G. Jakobson, Jacob Shneider, Dan Lavie, Yael Nemirovsky, Shmuel Kaldor, Meriam Hershkovitz, Ehud Netzer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An electrostaticly driven micro resonator is fabricated from single-crystal silicon, using micromachining techniques. The displacement amplitude is measured through a differential capacitance measurement, implemented on a CMOS interface circuit, which also provides the excitation clocks for the resonator. The unique feature of this micromechanical system is the integration method applied for attaching the resonator to the CMOS chip. The integration is based upon indium bumps technology, which is now established in modules of infra-red focal plane arrays. A technology which is extended here for the first time, to the best of our knowledge, to micro electro mechanical systems.

Original languageEnglish
Title of host publicationProceedings of the 18th Convention of Electrical and Electronics Engineers in Israel
Pages2.5.2/1-5
StatePublished - 1995
EventProceedings of the 18th Convention of Electrical and Electronics Engineers in Israel - Tel Aviv, Isr
Duration: 7 Mar 19958 Mar 1995

Conference

ConferenceProceedings of the 18th Convention of Electrical and Electronics Engineers in Israel
CityTel Aviv, Isr
Period7/03/958/03/95

ASJC Scopus subject areas

  • General Engineering

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