TY - JOUR
T1 - Frequency-mixing spectroscopy of spins in diamond
AU - Attrash, Mohammed
AU - Masis, Sergei
AU - Hazanov, Sergey
AU - Shtempluck, Oleg
AU - Buks, Eyal
N1 - Publisher Copyright:
© 2023 American Physical Society.
PY - 2023/11
Y1 - 2023/11
N2 - Frequency-mixing processes in spin systems have a variety of applications in meteorology and in quantum data processing. Spin spectroscopy based on frequency mixing offers some advantages, including the ability to eliminate crosstalk between driving and detection. We experimentally explore nonlinear frequency-mixing processes with negatively charged nitrogen-vacancy defects in diamond at low temperatures, and near level anticrossing. The experimental setup allows simultaneously applying magnetic driving in the longitudinal and transverse directions. Magnetic resonance detection is demonstrated using both Landau-Zener-Stückelberg interferometry and two-tone driving spectroscopy. The experimental results are compared with predictions of a theoretical analysis based on the rotating wave approximation.
AB - Frequency-mixing processes in spin systems have a variety of applications in meteorology and in quantum data processing. Spin spectroscopy based on frequency mixing offers some advantages, including the ability to eliminate crosstalk between driving and detection. We experimentally explore nonlinear frequency-mixing processes with negatively charged nitrogen-vacancy defects in diamond at low temperatures, and near level anticrossing. The experimental setup allows simultaneously applying magnetic driving in the longitudinal and transverse directions. Magnetic resonance detection is demonstrated using both Landau-Zener-Stückelberg interferometry and two-tone driving spectroscopy. The experimental results are compared with predictions of a theoretical analysis based on the rotating wave approximation.
UR - http://www.scopus.com/inward/record.url?scp=85176143594&partnerID=8YFLogxK
U2 - 10.1103/PhysRevApplied.20.054001
DO - 10.1103/PhysRevApplied.20.054001
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AN - SCOPUS:85176143594
SN - 2331-7019
VL - 20
JO - Physical Review Applied
JF - Physical Review Applied
IS - 5
M1 - 054001
ER -